language: en

Semi-Analytical Techniques for Substrate Characterization in the Design of Mixed-Signal ICs

Edoardo Charbon, Ranjit Gharpurey , Robert G. Meyer , and Alberto Sangiovanni-Vincentelli
Cadence Design Systems Inc.,
San Jose, CA Texas Instruments Inc., Dallas, TX
Department of EECS, University of California,
Berkeley, CA

Abstract A number of methods are presented for highly efficient calculation of substrate current transport. A three-dimensionalGreen's Function based substrate representation, in combination with the use of the Fast Fourier Transform, significantly speeds up the computation of sensitivities with respect to all parameters associated with a given architecture. Substrate sensitivity analysis is used in a number of physical optimization tools, such as placement and trend analysis for the estimation of the impact of technology migration and/or layout re-design.

1 Introduction